Differential Interference Contrast Microscope
微分干涉差显微镜Differential Interference Contrast Microscope
Differential interference contrast microscope (DIC), also known as Nomarski Interference Contrast (NIC) or Nomarski microscope, is an optical microscope illumination technique used to enhance the contrast in unstained, transparent samples. DIC sinowon metallurgical microscope mainly used to observe the working pieces which treated by sinowon metallurgical cutting machine, grinder/polisher, and mounting press, even tested by sinowon micro Vickers hardness tester MHV-1000ZK which focus on lower testing forces. DIC works on the principle of interferometry to gain information about the optical density of the sample, to see otherwise invisible features. A relatively complex lighting scheme produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. DIC works by separating a polarized light source into two beams which take slightly different paths through the sample, where the length of each optical path (i.e. the product of refractive index and geometric path length) differs, the beams interfere when they are recombined. This gives the appearance of a three-dimensional physical relief corresponding to the variation of optical density of the sample, emphasis lines and edges though not providing a topographically accurate image.www.sinowon.com.cn